Silicon carbide (SiC) tokana kristaly fitaovana manana bandy lehibe hantsana sakan'ny (~ Si 3 heny), avo mafana conductivity (~ Si 3.3 heny na GaAs in-10), avo electron saturation tahan'ny fifindra-monina (~ Si 2.5 fotoana), avo fahatapahana herinaratra saha (~ Si in-10 na GaAs in-5) sy ireo toetra miavaka hafa.
Ny angovo Semicera dia afaka manome ny mpanjifa amin'ny Conductive (Conductive), Semi-insulating (Semi-insulating), HPSI (High Purity semi-insulating) silikon carbide substrate; Ankoatra izany, dia afaka manome mpanjifa homogeneous sy heterogeneous silicone carbide epitaxial sheets; Azontsika atao ihany koa ny mampifanaraka ny takelaka epitaxial araka ny filan'ny mpanjifa manokana, ary tsy misy ny habetsaky ny baiko ambany indrindra.
IREO SINGA NASIANA | Famokarana | Research | Dummy |
Parametera kristaly | |||
Polytype | 4H | ||
Fahadisoan'ny orientation surface | <11-20 >4±0.15° | ||
Parametera elektrika | |||
Dopant | n-karazana azota | ||
Resistivity | 0.015-0.025ohm·cm | ||
Paramètre mekanika | |||
savaivony | 99.5 - 100mm | ||
hateviny | 350±25 μm | ||
Primary flat orientation | [1-100]±5° | ||
Lava fisaka voalohany | 32.5±1.5mm | ||
Toerana fisaka faharoa | 90° CW avy amin'ny fisaka voalohany ±5°. silisiôma miakatra | ||
Lava fisaka faharoa | 18±1.5mm | ||
TTV | ≤5 μm | ≤10 μm | ≤20 μm |
LTV | ≤2 μm (5mm * 5mm) | ≤5 μm (5mm * 5mm) | NA |
LOHAN-TSAMBO | -15μm ~ 15μm | -35μm ~ 35μm | -45μm ~ 45μm |
aretina | ≤20 μm | ≤45 μm | ≤50 μm |
Eo anoloana (Si-face) henjana (AFM) | Ra≤0.2nm (5μm*5μm) | ||
FIRAFITRA | |||
hakitroky micropipe | ≤1 ea/cm2 | ≤5 ea/cm2 | ≤10 ea/cm2 |
Fahalotoana metaly | ≤5E10atoms/cm2 | NA | |
BPD | ≤1500 ea/cm2 | ≤3000 ea/cm2 | NA |
TSD | ≤500 ea/cm2 | ≤1000 ea/cm2 | NA |
Quality Front | |||
anoloana | Si | ||
Famaranana ambonin'ny tany | Si-face CMP | ||
poti | ≤60ea/wafer (habe≥0.3μm) | NA | |
scratches | ≤2ea/mm. Mitambatra halavany ≤Diameter | Cumulative length≤2 * Diameter | NA |
Hodi-boasary / lavaka / tasy / striations / triatra / loto | tsy misy | NA | |
Sisiny chips/indents/fracture/hex takelaka | tsy misy | NA | |
faritra polytype | tsy misy | Faritra mitambatra≤20% | Faritra mitambatra≤30% |
Famaritana tamin'ny laser anoloana | tsy misy | ||
Quality Back | |||
Famaranana miverina | C-face CMP | ||
scratches | ≤5ea/mm, Mitambatra halavany≤2 * Savaivony | NA | |
Kilema lamosina (tsisin'ny sisiny) | tsy misy | ||
Ny henjana lamosina | Ra≤0.2nm (5μm*5μm) | ||
Back laser marking | 1 mm (avy amin'ny sisiny ambony) | ||
sisin'ny | |||
sisin'ny | Chamfer | ||
Fonosana | |||
Fonosana | Feno azota ny kitapo anatiny ary esorina ny kitapo ivelany. Kasety multi-wafer, epi-ready. | ||
* Fanamarihana: "NA" dia midika hoe tsy misy fangatahana Ny singa tsy voalaza dia mety manondro SEMI-STD. |